Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11790515 | Detecting defects in semiconductor specimens using weak labeling | Irad Peleg, Boaz Cohen | 2023-10-17 |
| 11449711 | Machine learning-based defect detection of a specimen | Ran BADANES, Boaz Cohen, Irad Peleg, Denis Suhanov, Ore SHTALRID | 2022-09-20 |
| 11379972 | Detecting defects in semiconductor specimens using weak labeling | Irad Peleg, Boaz Cohen | 2022-07-05 |
| 11151710 | Automatic selection of algorithmic modules for examination of a specimen | Eyal Zakkay, Boaz Cohen | 2021-10-19 |
| 10340116 | Imaging an area that includes an upper surface and a hole | Vladislav Kaplan, Shachar Paz | 2019-07-02 |
| 10101206 | Spectral imaging method and system | Ariel Raz, David Mendlovic | 2018-10-16 |
| 9900562 | System and method for light-field imaging | David Mendlovic, Uri Eliezer Mendlovic | 2018-02-20 |
| 9490101 | System and method for scanning an object | Yuval Gronau, Ishai Schwarzband, Benzion Sender, Dror Shemesh, Ofir Greenberg | 2016-11-08 |