Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11301987 | Determining locations of suspected defects | Dan Segal, Dae Hwan Youn, Tal Ben-Shlomo | 2022-04-12 |
| 9673022 | Review of suspected defects using one or more reference dies | Yuval Gronau | 2017-06-06 |
| 9490101 | System and method for scanning an object | Yuval Gronau, Ishai Schwarzband, Benzion Sender, Dror Shemesh, Ran Schleyen | 2016-11-08 |