Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12260543 | Machine learning based examination of a semiconductor specimen and training thereof | Shalom Elkayam, Shaul Cohen, Tomer Peled | 2025-03-25 |
| 11631179 | Segmentation of an image of a semiconductor specimen | Elad Ben Baruch, Shalom Elkayam, Shaul Cohen | 2023-04-18 |
| 11301987 | Determining locations of suspected defects | Ofir Greenberg, Dan Segal, Dae Hwan Youn | 2022-04-12 |
| 11232550 | Generating a training set usable for examination of a semiconductor specimen | Elad Ben Baruch, Shalom Elkayam, Shaul Cohen | 2022-01-25 |
| D558504 | Dispenser | Itamar Burstein, Guy Ben Zur | 2008-01-01 |
| D552417 | Holder | Itamar Burstein, Guy Ben Zur | 2007-10-09 |
| D543457 | Dispenser | Itamar Burstein, Guy Ben Zur | 2007-05-29 |
| D543076 | Holder | Itamar Burstein | 2007-05-22 |
| D542601 | Holder | Itamar Burstein | 2007-05-15 |