Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11449982 | Systems and methods of using absorptive imaging metrology to measure the thickness of ophthalmic lenses | Michael F. Widman, Peter W. Sites, D. Scott Dewald, Bradley W. Walker | 2022-09-20 |
| 10607335 | Systems and methods of using absorptive imaging metrology to measure the thickness of ophthalmic lenses | Michael F. Widman, Peter W. Sites, D. Scott Dewald, Bradley W. Walker | 2020-03-31 |
| 10492675 | System and method for determining corrective vision | Michael F. Widman, James T. Davis, II | 2019-12-03 |