Patents per Year
Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 12511720 | Image denoising for examination of a semiconductor specimen | Tamir Einy, Yarden Zohar, Anna Levant | 2025-12-30 | |
| 12423798 | Shape localization for examining a semiconductor specimen | Gilad VERED, Uri Hadar, Elran Gamzo | 2025-09-23 | |
| 11862522 | Accuracy improvements in optical metrology | Barak Bringoltz, Evgeni Gurevich, Ido Adam, Yoel Feler, Yuval Lamhot +6 more | 2024-01-02 | |
| 11054752 | Device metrology targets and methods | Eran Amit, Daniel Kandel, Amit Shaked, Liran Yerushalmi | 2021-07-06 | $92,735,000 |
| 11022566 | Examination of a semiconductor specimen | Shalom Elkayam, Shaul Cohen | 2021-06-01 | $74,932,000 |
| 10571811 | Device metrology targets and methods | Eran Amit, Daniel Kandel, Amit Shaked, Liran Yerushalmi | 2020-02-25 | |
| 10409171 | Overlay control with non-zero offset prediction | Michael Adel, Amnon Manassen, William Pierson, Ady Levy, Pradeep Subrahmanyan +4 more | 2019-09-10 |