Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12423798 | Shape localization for examining a semiconductor specimen | Gilad VERED, Uri Hadar, Elran Gamzo | 2025-09-23 |
| 11862522 | Accuracy improvements in optical metrology | Barak Bringoltz, Evgeni Gurevich, Ido Adam, Yoel Feler, Yuval Lamhot +6 more | 2024-01-02 |
| 11054752 | Device metrology targets and methods | Eran Amit, Daniel Kandel, Amit Shaked, Liran Yerushalmi | 2021-07-06 |
| 11022566 | Examination of a semiconductor specimen | Shalom Elkayam, Shaul Cohen | 2021-06-01 |
| 10571811 | Device metrology targets and methods | Eran Amit, Daniel Kandel, Amit Shaked, Liran Yerushalmi | 2020-02-25 |
| 10409171 | Overlay control with non-zero offset prediction | Michael Adel, Amnon Manassen, William Pierson, Ady Levy, Pradeep Subrahmanyan +4 more | 2019-09-10 |