Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11862522 | Accuracy improvements in optical metrology | Barak Bringoltz, Evgeni Gurevich, Yoel Feler, Dror Alumot, Yuval Lamhot +6 more | 2024-01-02 |
| 11158548 | Overlay measurement using multiple wavelengths | Yuval Lamhot, Eran Amit, Einat Peled, Noga Sella, Wei-Te Cheng | 2021-10-26 |
| 11112704 | Mitigation of inaccuracies related to grating asymmetries in scatterometry measurements | Vladimir Levinski, Amnon Manassen, Yuval Lubashevsky | 2021-09-07 |
| 10831108 | Method of analyzing and utilizing landscapes to reduce or eliminate inaccuracy in overlay optical metrology | Tal Marciano, Barak Bringoltz, Evgeni Gurevich, Ze'ev Lindenfeld, Zeng Zhao +17 more | 2020-11-10 |