Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11862522 | Accuracy improvements in optical metrology | Barak Bringoltz, Evgeni Gurevich, Ido Adam, Yoel Feler, Dror Alumot +6 more | 2024-01-02 |
| 11158548 | Overlay measurement using multiple wavelengths | Yuval Lamhot, Eran Amit, Einat Peled, Wei-Te Cheng, Ido Adam | 2021-10-26 |
| 10831108 | Method of analyzing and utilizing landscapes to reduce or eliminate inaccuracy in overlay optical metrology | Tal Marciano, Barak Bringoltz, Evgeni Gurevich, Ido Adam, Ze'ev Lindenfeld +17 more | 2020-11-10 |
| 10699969 | Quick adjustment of metrology measurement parameters according to process variation | Einat Peled, Eran Amit, Alexander Svizher, Yuval Lamhot, Wei-Te Cheng | 2020-06-30 |