Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12409332 | Methods and apparatuses for delivering tumor treating fields to a subject's body for near-surface tumors | Smadar Arvatz, Boaz Marsault | 2025-09-09 |
| 12333713 | Methods and apparatuses for determining transducer locations to generate tumor treating fields | Oshrit Zeevi | 2025-06-17 |
| 11725934 | Systems and methods for metrology optimization based on metrology landscapes | Dana Klein, Noa Armon | 2023-08-15 |
| 11333982 | Scaling metric for quantifying metrology sensitivity to process variation | Noa Armon, Dana Klein | 2022-05-17 |
| 11249400 | Per-site residuals analysis for accurate metrology measurements | Lilach Saltoun, Dana Klein | 2022-02-15 |
| 11237120 | Expediting spectral measurement in semiconductor device fabrication | Vincent Immer, Etay Lavert | 2022-02-01 |
| 10866090 | Estimating amplitude and phase asymmetry in imaging technology for achieving high accuracy in overlay metrology | Nadav Gutman, Yuri Paskover, Guy M. Cohen, Vladimir Levinski | 2020-12-15 |
| 10831108 | Method of analyzing and utilizing landscapes to reduce or eliminate inaccuracy in overlay optical metrology | Barak Bringoltz, Evgeni Gurevich, Ido Adam, Ze'ev Lindenfeld, Zeng Zhao +17 more | 2020-11-10 |
| 10761034 | Expediting spectral measurement in semiconductor device fabrication | Vincent Immer, Etay Lavert | 2020-09-01 |
| 10415963 | Estimating and eliminating inter-cell process variation inaccuracy | Eran Amit, Barak Bringoltz, Nuriel Amir, Amit Shaked | 2019-09-17 |
| 10379449 | Identifying process variations during product manufacture | Tzahi Grunzweig, Nadav Gutman, Claire E. Staniunas, Nimrod Shuall | 2019-08-13 |
| 10317198 | Three-dimensional mapping of a wafer | Vincent Immer, Naomi Ittah | 2019-06-11 |
| 10203200 | Analyzing root causes of process variation in scatterometry metrology | Michael Adel, Mark Ghinovker, Barak Bringoltz, Dana Klein, Tal Itzkovich +2 more | 2019-02-12 |
| 9903711 | Feed forward of metrology data in a metrology system | Ady Levy, Daniel Kandel, Michael Adel, Leonid Poslavsky, John Robinson +9 more | 2018-02-27 |