Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11725934 | Systems and methods for metrology optimization based on metrology landscapes | Dana Klein, Tal Marciano | 2023-08-15 |
| 11333982 | Scaling metric for quantifying metrology sensitivity to process variation | Tal Marciano, Dana Klein | 2022-05-17 |