Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10817999 | Image-based overlay metrology and monitoring using through-focus imaging | David Gready, Claire E. Staniunas | 2020-10-27 |
| 10565697 | Utilizing overlay misregistration error estimations in imaging overlay metrology | Tzahi Grunzweig, Nadav Gutman, David Gready, Mark Ghinovker, Vladimir Levinski +2 more | 2020-02-18 |
| 10379449 | Identifying process variations during product manufacture | Tzahi Grunzweig, Nadav Gutman, Claire E. Staniunas, Tal Marciano | 2019-08-13 |
| 9329033 | Method for estimating and correcting misregistration target inaccuracy | Eran Amit, Dana Klein, Guy M. Cohen, Amir Widmann, Amnon Manassen +1 more | 2016-05-03 |