Amir Widmann — 19 Patents at Kla-Tencor

Amir Widmann has been granted 19 US patents while listed as an inventor at Kla-Tencor. The first was granted in 2005 and the most recent in November 2022. Amir Widmann ranks #229,345 of 4,157,543 US inventors in our database (top 5.5%). Patent records list Amir Widmann in Hadera, CA, IL.

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Showing 1–19 of 19 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
11498189	Wrench	Agmon David Porat	2022-11-15
10649447	Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers	Pavel Izikson, John Robinson, Mike Adel, DongSub Choi, Anat Marchelli	2020-05-12
9651943	Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers	Pavel Izikson, John Robinson, Mike Adel, DongSub Choi, Anat Marchelli	2017-05-16
9576861	Method and system for universal target based inspection and metrology	Allen Park, Ellis Chang, Michael Adel, Kris Bhaskar, Ady Levy +2 more	2017-02-21
9558978	Material handling with dedicated automated material handling system	Michael Adel, Pati Sekula	2017-01-31
9329033	Method for estimating and correcting misregistration target inaccuracy	Eran Amit, Dana Klein, Guy M. Cohen, Nimrod Shuall, Amnon Manassen +1 more	2016-05-03
9170209	Inspection guided overlay metrology	Ellis Chang, Allen Park	2015-10-27
9116442	Feedforward/feedback litho process control of stress and overlay	Michael Adel, John Fielden, John Robinson, DongSub Choi	2015-08-25
8948495	Inspecting a wafer and/or predicting one or more characteristics of a device being formed on a wafer	Gino Marcuccilli, Ellis Chang, John Robinson, Allen Park	2015-02-03	$11,706,000
8804137	Unique mark and method to determine critical dimension uniformity and registration of reticles combined with wafer overlay capability	DongSub Choi, Zain Saidin, Frank Laske, John Robinson	2014-08-12	$14,552,000
8655469	Advanced process control optimization	DongSub Choi, Daniel Kandel, David Tien	2014-02-18	$21,598,000
8559001	Inspection guided overlay metrology	Ellis Chang, Allen Park	2013-10-15	$26,611,000
8175831	Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers	Pavel Izikson, John Robinson, Mike Adel, DongSub Choi, Anat Marchelli	2012-05-08	$24,046,000
8111376	Feedforward/feedback litho process control of stress and overlay	Michael Adel, John Fielden, John Robinson, DongSub Choi	2012-02-07	$8,181,000
8045786	Waferless recipe optimization	Mark Ghinovker, Dror Francis	2011-10-25	$7,626,000
7925486	Computer-implemented methods, carrier media, and systems for creating a metrology target structure design for a reticle layout	Mark D. Smith, Robert Hardister, Mike Pochkowski, Elyakim Kassel, Mike Adel	2011-04-12	$7,605,000
7679069	Method and system for optimizing alignment performance in a fleet of exposure tools	Michael Adel, John Robinson, Pavel Izikson, Brad Eichelberger, Atsuhiko Kato	2010-03-16	$8,972,000
7561282	Techniques for determining overlay and critical dimension using a single metrology tool	—	2009-07-14	$12,291,000
6864458	Iced film substrate cleaning	David Yogev, Yoram Uziel	2005-03-08	$23,793,000

Amir Widmann — 19 Patents

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