Issued Patents All Time
Showing 25 most recent of 30 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11769242 | Mode selection and defect detection training | Jing Zhang, Yujie Dong, Vishank Bhatia, Patrick McBride, Brian Duffy | 2023-09-26 |
| 11644756 | 3D structure inspection or metrology using deep learning | Scott A. Young, Lena Nicolaides | 2023-05-09 |
| 11580375 | Accelerated training of a machine learning based model for semiconductor applications | Laurent Karsenti, Scott A. Young, Mohan Mahadevan, Jing Zhang, Brian Duffy +4 more | 2023-02-14 |
| 11580398 | Diagnostic systems and methods for deep learning models configured for semiconductor applications | Jing Zhang, Ravi Chandra Donapati, Mark J. Roulo | 2023-02-14 |
| 11551348 | Learnable defect detection for semiconductor applications | Jing Zhang, Zhuoning Yuan, Yujie Dong | 2023-01-10 |
| 11415526 | Multi-controller inspection system | Brian Duffy, Mark J. Roulo, Ashok Mathew, Jing Zhang | 2022-08-16 |
| 10713769 | Active learning for defect classifier training | Jing Zhang, Yujie Dong, Brian Duffy, Richard Wallingford, Michael Daino | 2020-07-14 |
| 10648924 | Generating high resolution images from low resolution images for semiconductor applications | Jing Zhang, Grace Hsiu-Ling Chen, Keith Wells, Nan BAI, Ping Gu +1 more | 2020-05-12 |
| 10599951 | Training a neural network for defect detection in low resolution images | Laurent Karsenti, Brad Ries, Lena Nicolaides, Richard (Seng Wee) Yeoh, Stephen Hiebert | 2020-03-24 |
| 10402461 | Virtual inspection systems for process window characterization | Laurent Karsenti, Mark Wagner, Brian Duffy, Vijayakumar Ramachandran | 2019-09-03 |
| 10395356 | Generating simulated images from input images for semiconductor applications | Jing Zhang | 2019-08-27 |
| 10360477 | Accelerating semiconductor-related computations using learning based models | Scott A. Young, Mark J. Roulo, Jing Zhang, Laurent Karsenti, Mohan Mahadevan +1 more | 2019-07-23 |
| 10346740 | Systems and methods incorporating a neural network and a forward physical model for semiconductor applications | Jing Zhang | 2019-07-09 |
| 10186026 | Single image detection | Laurent Karsenti, John R. Jordan, Sankar Venkataraman, Yair Carmon | 2019-01-22 |
| 10181185 | Image based specimen process control | Allen Park, Lisheng Gao, Ashok Kulkarni, Saibal Banerjee, Ping Gu +1 more | 2019-01-15 |
| 10043261 | Generating simulated output for a specimen | Jing Zhang, Grace Hsiu-Ling Chen, Ashok Kulkarni, Laurent Karsenti | 2018-08-07 |
| 9965901 | Generating simulated images from design information | Jing Zhang | 2018-05-08 |
| 9916965 | Hybrid inspectors | Grace Hsiu-Ling Chen, Keith Wells, Wayne McMillan, Jing Zhang, Scott A. Young +1 more | 2018-03-13 |
| 9576861 | Method and system for universal target based inspection and metrology | Allen Park, Ellis Chang, Michael Adel, Ady Levy, Amir Widmann +2 more | 2017-02-21 |
| 9355208 | Detecting defects on a wafer | Eugene Shifrin, Ashok Kulkarni, Graham Michael Lynch, John R. Jordan, Chwen-Jiann Fang | 2016-05-31 |
| 9262821 | Inspection recipe setup from reference image variation | Eugene Shifrin, Chetana Bhaskar, Ashok Kulkarni, Chien-Huei Chen, Brian Duffy | 2016-02-16 |
| 9222771 | Acquisition of information for a construction site | Eliezer Rosengaus, Ady Levy | 2015-12-29 |
| 9222895 | Generalized virtual inspector | Brian Duffy | 2015-12-29 |
| 9176072 | Dark field inspection system with ring illumination | Guoheng Zhao, Mehdi Vaez-Iravani, Scott A. Young | 2015-11-03 |
| 8422010 | Methods and systems for determining a characteristic of a wafer | Michael D. Kirk, Christopher F. Bevis, David L. Adler | 2013-04-16 |