Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11922619 | Context-based defect inspection | Brian Duffy, Bradley Ries, Kuljit S. Virk, Asaf J. Elron, Ruslan Berdichevsky +7 more | 2024-03-05 |
| 11580375 | Accelerated training of a machine learning based model for semiconductor applications | Kris Bhaskar, Scott A. Young, Mohan Mahadevan, Jing Zhang, Brian Duffy +4 more | 2023-02-14 |
| 10599951 | Training a neural network for defect detection in low resolution images | Kris Bhaskar, Brad Ries, Lena Nicolaides, Richard (Seng Wee) Yeoh, Stephen Hiebert | 2020-03-24 |
| 10535131 | Systems and methods for region-adaptive defect detection | Christopher Maher, Bjorn Brauer, Vijayakumar Ramachandran, Eliezer Rosengaus, John R. Jordan +1 more | 2020-01-14 |
| 10402461 | Virtual inspection systems for process window characterization | Kris Bhaskar, Mark Wagner, Brian Duffy, Vijayakumar Ramachandran | 2019-09-03 |
| 10395362 | Contour based defect detection | Ajay Gupta, Mohan Mahadevan, Sankar Venkataraman, Hedong Yang, Yair Carmon +2 more | 2019-08-27 |
| 10360477 | Accelerating semiconductor-related computations using learning based models | Kris Bhaskar, Scott A. Young, Mark J. Roulo, Jing Zhang, Mohan Mahadevan +1 more | 2019-07-23 |
| 10186026 | Single image detection | Kris Bhaskar, John R. Jordan, Sankar Venkataraman, Yair Carmon | 2019-01-22 |
| 10043261 | Generating simulated output for a specimen | Kris Bhaskar, Jing Zhang, Grace Hsiu-Ling Chen, Ashok Kulkarni | 2018-08-07 |
| 9183624 | Detecting defects on a wafer with run time use of design data | Brian Duffy | 2015-11-10 |
| 7764824 | Method for defect detection and process monitoring based on SEM images | — | 2010-07-27 |