Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11047806 | Defect discovery and recipe optimization for inspection of three-dimensional semiconductor structures | Santosh Bhattacharyya, Devashish Sharma, Bo Hua, Philip Measor, Robert M. Danen | 2021-06-29 |
| 10535131 | Systems and methods for region-adaptive defect detection | Bjorn Brauer, Vijayakumar Ramachandran, Laurent Karsenti, Eliezer Rosengaus, John R. Jordan +1 more | 2020-01-14 |
| 9754761 | High-speed hotspot or defect imaging with a charged particle beam system | Hong Xiao | 2017-09-05 |
| 9483819 | Contour-based array inspection of patterned defects | Chien-Huei Chen, Ajay Gupta, Thanh Huy Ha, Jianwei Wang, Hedong Yang +1 more | 2016-11-01 |
| 8989479 | Region based virtual fourier filter | Lisheng Gao, Kenong Wu, Allen Park, Ellis Chang, Khurram Zafar +5 more | 2015-03-24 |