Issued Patents All Time
Showing 25 most recent of 38 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12320626 | Gel stemming delivery system | Edward Baker, Andrew R. Wheeler, Damien Browne | 2025-06-03 |
| 11784097 | Measurement of overlay error using device inspection system | Choon Hoong Hoo, Fangren Ji, Amnon Manassen, Liran Yerushalmi, Antonio Mani +3 more | 2023-10-10 |
| 11688052 | Computer assisted weak pattern detection and quantification system | Naoshin Haque, Ajay Gupta | 2023-06-27 |
| 11295438 | Method and system for mixed mode wafer inspection | Jason Z. Lin, Ellis Chang, Richard Wallingford, Songnian Rong, Chetana Bhaskar | 2022-04-05 |
| 11155040 | Adaptive material deposition for additive manufacturing | Wojciech Matusik, Javier Ramos, Kiril Vidimce | 2021-10-26 |
| 11060832 | Blasting method and system | — | 2021-07-13 |
| 10943838 | Measurement of overlay error using device inspection system | Choon Hoong Hoo, Fangren Ji, Amnon Manassen, Liran Yerushalmi, Antonio Mani +3 more | 2021-03-09 |
| 10818001 | Using stochastic failure metrics in semiconductor manufacturing | Wing-Shan Ribi Leung, Kaushik Sah, Andrew Cross | 2020-10-27 |
| 10796065 | Hybrid design layout to identify optical proximity correction-related systematic defects | Ankit Jain | 2020-10-06 |
| 10740888 | Computer assisted weak pattern detection and quantification system | Naoshin Haque, Ajay Gupta | 2020-08-11 |
| 10483081 | Self directed metrology and pattern classification | Ajay Gupta, Jan Lauber | 2019-11-19 |
| 10456984 | Adaptive material deposition for additive manufacturing | Wojciech Matusik, Javier Ramos, Kiril Vidimce | 2019-10-29 |
| 10359371 | Determining one or more characteristics of a pattern of interest on a specimen | Brian Duffy, Ashok Kulkarni, Michael Lennek | 2019-07-23 |
| 10262408 | System, method and computer program product for systematic and stochastic characterization of pattern defects identified from a semiconductor wafer | Moshe E. Preil, Andrew Cross | 2019-04-16 |
| 10262831 | Method and system for weak pattern quantification | Andrew Cross | 2019-04-16 |
| 10223492 | Based device risk assessment | Youseung Jin, Sungchan Cho, Barry Saville | 2019-03-05 |
| 10192303 | Method and system for mixed mode wafer inspection | Jason Z. Lin, Ellis Chang, Richard Wallingford, Songnian Rong, Chetana Bhaskar | 2019-01-29 |
| 10181185 | Image based specimen process control | Lisheng Gao, Ashok Kulkarni, Saibal Banerjee, Ping Gu, Songnian Rong +1 more | 2019-01-15 |
| 10062012 | Finding patterns in a design based on the patterns and their surroundings | Michael Lennek | 2018-08-28 |
| 10030959 | Blasting systems and methods | — | 2018-07-24 |
| 9940705 | System, method and computer program product for detecting defects in a fabricated target component using consistent modulation for the target and reference components | Martin Plihal | 2018-04-10 |
| 9576861 | Method and system for universal target based inspection and metrology | Ellis Chang, Michael Adel, Kris Bhaskar, Ady Levy, Amir Widmann +2 more | 2017-02-21 |
| 9536299 | Pattern failure discovery by leveraging nominal characteristics of alternating failure modes | — | 2017-01-03 |
| 9518932 | Metrology optimized inspection | Craig MacNaughton, Ellis Chang | 2016-12-13 |
| 9401014 | Methods and systems for utilizing design data in combination with inspection data | Khurram Zafar, Sagar A. Kekare, Ellis Chang, Peter Rose | 2016-07-26 |