Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11348222 | Methods and systems for inspection of wafers and reticles using designer intent data | Paul Frank Marella, Sharon McCauley, Ellis Chang, William Volk, James Wiley +2 more | 2022-05-31 |
| 10713771 | Methods and systems for inspection of wafers and reticles using designer intent data | Paul Frank Marella, Sharon McCauley, Ellis Chang, William Volk, James Wiley +2 more | 2020-07-14 |
| 10303839 | Electrically relevant placement of metrology targets using design analysis | — | 2019-05-28 |
| 10209628 | System and method for defect classification based on electrical design intent | Prasanti Uppaluri, Thirupurasundari Jayaraman, Ardis Liang, Srikanth Kandukuri | 2019-02-19 |
| 9689923 | Adaptive electrical testing of wafers | — | 2017-06-27 |
| 9401014 | Methods and systems for utilizing design data in combination with inspection data | Khurram Zafar, Ellis Chang, Allen Park, Peter Rose | 2016-07-26 |
| 9400865 | Extracting comprehensive design guidance for in-line process control tools and methods | Sergei G. Bakarian | 2016-07-26 |
| 9002497 | Methods and systems for inspection of wafers and reticles using designer intent data | William Volk, James Wiley, Sterling Watson, Carl Hess, Paul Frank Marella +2 more | 2015-04-07 |
| 8923600 | Methods and systems for utilizing design data in combination with inspection data | Khurram Zafar, Ellis Chang, Allen Park, Peter Rose | 2014-12-30 |
| 8549445 | Targeted production control using multivariate analysis of design marginalities | — | 2013-10-01 |
| 7769225 | Methods and systems for detecting defects in a reticle design pattern | Ingrid B. Peterson, Moshe E. Preil | 2010-08-03 |
| 7570796 | Methods and systems for utilizing design data in combination with inspection data | Khurram Zafar, Ellis Chang, Allen Park, Peter Rose | 2009-08-04 |