Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10620134 | Creating defect samples for array regions | Vidyasagar Anantha, Manikandan Mariyappan, Raghav Babulnath, Gangadharan Sivaraman, Satya Kurada +2 more | 2020-04-14 |
| 10387601 | Methods to store dynamic layer content inside a design file | Srikanth Kandukuri, Gordon Rouse, Anil Raman, Kenong Wu, Praveen Gunasekaran +2 more | 2019-08-20 |
| 10209628 | System and method for defect classification based on electrical design intent | Prasanti Uppaluri, Ardis Liang, Srikanth Kandukuri, Sagar A. Kekare | 2019-02-19 |
| 10204416 | Automatic deskew using design files or inspection images | Arpit Jain, Arpit Yati, Raghavan Konuru, Raj Kuppa, Hema Prasad +2 more | 2019-02-12 |
| 9996942 | Sub-pixel alignment of inspection to design | Santosh Bhattacharyya, Pavan Kumar, Lisheng Gao, Raghav Babulnath, Srikanth Kandukuri +4 more | 2018-06-12 |
| 9865512 | Dynamic design attributes for wafer inspection | Raghav Babulnath | 2018-01-09 |