Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11270430 | Wafer inspection using difference images | Abdurrahman Sezginer, Xiaochun Li, Junqing Huang, Lisheng Gao, Grace Hsiu-Ling Chen +2 more | 2022-03-08 |
| 10572991 | System and method for aligning semiconductor device reference images and test images | Hong-Ching Chen, Michael Cook, Kenong Wu | 2020-02-25 |
| 9996942 | Sub-pixel alignment of inspection to design | Santosh Bhattacharyya, Lisheng Gao, Thirupurasundari Jayaraman, Raghav Babulnath, Srikanth Kandukuri +4 more | 2018-06-12 |
| 9710959 | Compressed 3D graphics rendering exploiting psychovisual properties | Adithya Pediredla, Biju Puthur Simon | 2017-07-18 |