Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10712289 | Inspection for multiple process steps in a single inspection process | Oksen Baris | 2020-07-14 |
| 10620134 | Creating defect samples for array regions | Vidyasagar Anantha, Manikandan Mariyappan, Gangadharan Sivaraman, Satya Kurada, Thirupurasundari Jayaraman +2 more | 2020-04-14 |
| 10127652 | Defect detection and classification based on attributes determined from a standard reference image | Lisheng Gao, Avijit K. Ray-Chaudhuri, Kenong Wu | 2018-11-13 |
| 9996942 | Sub-pixel alignment of inspection to design | Santosh Bhattacharyya, Pavan Kumar, Lisheng Gao, Thirupurasundari Jayaraman, Srikanth Kandukuri +4 more | 2018-06-12 |
| 9865512 | Dynamic design attributes for wafer inspection | Thirupurasundari Jayaraman | 2018-01-09 |
| 9835566 | Adaptive nuisance filter | Ardis Liang, Martin Plihal, Sankar Venkataraman | 2017-12-05 |
| 9766187 | Repeater detection | Hong Chen, Kenong Wu, Eugene Shifrin, Masatoshi Yamaoka, Gangadharan Sivaraman +2 more | 2017-09-19 |
| 9563943 | Based sampling and binning for yield critical defects | Satya Kurada, Kwok Ng, Lisheng Gao | 2017-02-07 |
| 9310320 | Based sampling and binning for yield critical defects | Satya Kurada, Kwok Ng, Lisheng Gao | 2016-04-12 |