Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10620134 | Creating defect samples for array regions | Vidyasagar Anantha, Manikandan Mariyappan, Raghav Babulnath, Gangadharan Sivaraman, Thirupurasundari Jayaraman +2 more | 2020-04-14 |
| 9766187 | Repeater detection | Hong Chen, Kenong Wu, Eugene Shifrin, Masatoshi Yamaoka, Gangadharan Sivaraman +2 more | 2017-09-19 |
| 9563943 | Based sampling and binning for yield critical defects | Raghav Babulnath, Kwok Ng, Lisheng Gao | 2017-02-07 |
| 9310320 | Based sampling and binning for yield critical defects | Raghav Babulnath, Kwok Ng, Lisheng Gao | 2016-04-12 |