Issued Patents All Time
Showing 25 most recent of 33 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12190498 | Print check repeater defect detection | Nurmohammed Patwary, James A. Smith, Heonju SHIN, Jusang Maeng, Xiaochun Li +1 more | 2025-01-07 |
| 11328411 | Print check repeater defect detection | Hong Chen, Xiaochun Li, James A. Smith, Eugene Shifrin, Qing Luo +7 more | 2022-05-10 |
| 11139216 | System, method and non-transitory computer readable medium for tuning sensitivities of, and determining a process window for, a modulated wafer | David Craig Oram, Abhinav Mathur, Eugene Shifrin | 2021-10-05 |
| 11067516 | High accuracy of relative defect locations for repeater analysis | Shishir Suman, Hong Chen | 2021-07-20 |
| 10923317 | Detecting defects in a logic region on a wafer | Junqing Huang, Paul Russell, Hucheng Lee | 2021-02-16 |
| 10679909 | System, method and non-transitory computer readable medium for tuning sensitivies of, and determining a process window for, a modulated wafer | David Craig Oram, Abhinav Mathur, Eugene Shifrin | 2020-06-09 |
| 10572991 | System and method for aligning semiconductor device reference images and test images | Hong-Ching Chen, Michael Cook, Pavan Kumar | 2020-02-25 |
| 10395359 | Adaptive local threshold and color filtering | Junqing Huang, Hucheng Lee, Lisheng Gao | 2019-08-27 |
| 10387601 | Methods to store dynamic layer content inside a design file | Thirupurasundari Jayaraman, Srikanth Kandukuri, Gordon Rouse, Anil Raman, Praveen Gunasekaran +2 more | 2019-08-20 |
| 10365232 | High accuracy of relative defect locations for repeater analysis | Shishir Suman | 2019-07-30 |
| 10339262 | System and method for defining care areas in repeating structures of design data | Junqing Huang, Soren Konecky, Hucheng Lee, Lisheng Gao | 2019-07-02 |
| 10127652 | Defect detection and classification based on attributes determined from a standard reference image | Lisheng Gao, Avijit K. Ray-Chaudhuri, Raghav Babulnath | 2018-11-13 |
| 9846930 | Detecting defects on a wafer using defect-specific and multi-channel information | Lisheng Gao, Grace Hsiu-Ling Chen, David W. Shortt | 2017-12-19 |
| 9766186 | Array mode repeater detection | Hong Chen, Eugene Shifrin, Masatoshi Yamaoka | 2017-09-19 |
| 9766187 | Repeater detection | Hong Chen, Eugene Shifrin, Masatoshi Yamaoka, Gangadharan Sivaraman, Raghav Babulnath +2 more | 2017-09-19 |
| 9727047 | Defect detection using structural information | Qing Luo, Hucheng Lee, Lisheng Gao, Eugene Shifrin, Yan Xiong +1 more | 2017-08-08 |
| 9721337 | Detecting defects on a wafer using defect-specific information | Meng-Che Wu, Lisheng Gao | 2017-08-01 |
| 9704234 | Adaptive local threshold and color filtering | Junqing Huang, Hucheng Lee, Lisheng Gao | 2017-07-11 |
| 9601393 | Selecting one or more parameters for inspection of a wafer | Chris W. Lee, Lisheng Gao, Tao Luo, Tommaso Torelli, Michael J. Van Riet +1 more | 2017-03-21 |
| 9552636 | Detecting defects on a wafer using defect-specific and multi-channel information | Lisheng Gao, Grace Hsiu-Ling Chen, David W. Shortt | 2017-01-24 |
| 9518934 | Wafer defect discovery | Hong Chen, Martin Plihal, Vidur Pandita, Ravikumar Sanapala, Vivek Bhagat +4 more | 2016-12-13 |
| 9360863 | Data perturbation for wafer inspection or metrology setup using a model of a difference | Govind Thattaisundaram, Mohan Mahadevan, Ajay Gupta, Chien-Huei Chen, Ashok Kulkarni +2 more | 2016-06-07 |
| 9310316 | Selecting parameters for defect detection methods | Chris W. Lee, Michael J. Van Riet, Yi-Chang Liu | 2016-04-12 |
| 9189844 | Detecting defects on a wafer using defect-specific information | Meng-Che Wu, Lisheng Gao | 2015-11-17 |
| 9171364 | Wafer inspection using free-form care areas | Tao Luo, Lisheng Gao, Eugene Shifrin, Aravindh Balaji | 2015-10-27 |