Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10923317 | Detecting defects in a logic region on a wafer | Junqing Huang, Hucheng Lee, Kenong Wu | 2021-02-16 |
| 6605948 | Test system for a gas turbine engine control programming plug | — | 2003-08-12 |