Issued Patents All Time
Showing 1–24 of 24 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12190498 | Print check repeater defect detection | Nurmohammed Patwary, James A. Smith, Heonju SHIN, Jusang Maeng, Kenong Wu +1 more | 2025-01-07 |
| 12056867 | Image contrast metrics for deriving and improving imaging conditions | Bjorn Brauer, Sangbong Park | 2024-08-06 |
| 11783470 | Design-assisted inspection for DRAM and 3D NAND devices | Junqing Huang, Sangbong Park, Xiaochun Li | 2023-10-10 |
| 11619592 | Selecting defect detection methods for inspection of a specimen | Bjorn Brauer, Sangbong Park | 2023-04-04 |
| 11615993 | Clustering sub-care areas based on noise characteristics | Boshi Huang, Vladimir Tumakov, Sangbong Park, Bjorn Brauer, Erfan Soltanmohammadi | 2023-03-28 |
| 11416982 | Controlling a process for inspection of a specimen | Bjorn Brauer, Sangbong Park | 2022-08-16 |
| 11308606 | Design-assisted inspection for DRAM and 3D NAND devices | Junqing Huang, Sangbong Park, Xiaochun Li | 2022-04-19 |
| 11244442 | Method and system for correlating optical images with scanning electron microscopy images | Lisheng Gao, Jan Lauber, Yong Zhang | 2022-02-08 |
| 11049745 | Defect-location determination using correction loop for pixel alignment | David Dowling, Tarunark Singh, Bjorn Brauer, Santosh Bhattacharyya, Bryant Mantiply +2 more | 2021-06-29 |
| 11010885 | Optical-mode selection for multi-mode semiconductor inspection | Bjorn Brauer, Richard Wallingford, Kedar Grama, Sangbong Park | 2021-05-18 |
| 10923317 | Detecting defects in a logic region on a wafer | Junqing Huang, Paul Russell, Kenong Wu | 2021-02-16 |
| 10599944 | Visual feedback for inspection algorithms and filters | Junqing Huang, Lisheng Gao | 2020-03-24 |
| 10557802 | Capture of repeater defects on a semiconductor wafer | Bjorn Brauer | 2020-02-11 |
| 10514685 | Automatic recipe stability monitoring and reporting | Lisheng Gao, Govindarajan Thattaisundaram | 2019-12-24 |
| 10410338 | Method and system for correlating optical images with scanning electron microscopy images | Lisheng Gao, Jan Lauber, Yong Zhang | 2019-09-10 |
| 10395358 | High sensitivity repeater defect detection | Bjorn Brauer, Eugene Shifrin, Ashok Mathew, Chetana Bhaskar, Lisheng Gao +2 more | 2019-08-27 |
| 10395359 | Adaptive local threshold and color filtering | Junqing Huang, Kenong Wu, Lisheng Gao | 2019-08-27 |
| 10393671 | Intra-die defect detection | Govindarajan Thattaisundaram, Lisheng Gao | 2019-08-27 |
| 10339262 | System and method for defining care areas in repeating structures of design data | Junqing Huang, Soren Konecky, Kenong Wu, Lisheng Gao | 2019-07-02 |
| 10304177 | Systems and methods of using z-layer context in logic and hot spot inspection for sensitivity improvement and nuisance suppression | Pavan Kumar Perali | 2019-05-28 |
| 10211025 | Determining a position of a defect in an electron beam image | Govindarajan Thattaisundaram | 2019-02-19 |
| 10151706 | Inspection for specimens with extensive die to die process variation | Santosh Bhattacharyya, Bjorn Brauer | 2018-12-11 |
| 9727047 | Defect detection using structural information | Qing Luo, Kenong Wu, Lisheng Gao, Eugene Shifrin, Yan Xiong +1 more | 2017-08-08 |
| 9704234 | Adaptive local threshold and color filtering | Junqing Huang, Kenong Wu, Lisheng Gao | 2017-07-11 |