Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12051183 | Training a machine learning model to generate higher resolution images from inspection images | Santosh Kumar | 2024-07-30 |
| 11010885 | Optical-mode selection for multi-mode semiconductor inspection | Bjorn Brauer, Richard Wallingford, Hucheng Lee, Sangbong Park | 2021-05-18 |