Issued Patents All Time
Showing 1–25 of 35 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12229935 | Semantic image segmentation for semiconductor-based applications | Bjorn Brauer | 2025-02-18 |
| 11983865 | Deep generative model-based alignment for semiconductor applications | Bjorn Brauer | 2024-05-14 |
| 11776108 | Deep learning based defect detection | Ge Cong, Sangbong Park | 2023-10-03 |
| 11592653 | Automated focusing system for tracking specimen surface with a configurable focus offset | Xiumei Liu, Kai Cao, Matthew Giusti, Brooke Bruguier | 2023-02-28 |
| 11431976 | System and method for inspection using tensor decomposition and singular value decomposition | Nurmohammed Patwary, James A. Smith, Xiaochun Li, Vladimir Tumakov, Bjorn Brauer | 2022-08-30 |
| 11330164 | Determining focus settings for specimen scans | Bryant Mantiply, Xiumei Liu, Matthew Giusti, Kai Cao | 2022-05-10 |
| 11295438 | Method and system for mixed mode wafer inspection | Jason Z. Lin, Allen Park, Ellis Chang, Songnian Rong, Chetana Bhaskar | 2022-04-05 |
| 11010885 | Optical-mode selection for multi-mode semiconductor inspection | Bjorn Brauer, Kedar Grama, Hucheng Lee, Sangbong Park | 2021-05-18 |
| 10713769 | Active learning for defect classifier training | Jing Zhang, Yujie Dong, Brian Duffy, Michael Daino, Kris Bhaskar | 2020-07-14 |
| 10605744 | Systems and methods for detecting defects on a wafer | Lu Chen, Jason Kirkwood, Mohan Mahadevan, James A. Smith, Lisheng Gao +2 more | 2020-03-31 |
| 10416087 | Systems and methods for defect detection using image reconstruction | Jing Zhang, Jeremy Nesbitt, Grace Hsiu-Ling Chen | 2019-09-17 |
| 10402688 | Data augmentation for convolutional neural network-based defect inspection | Bjorn Brauer, Vijay Ramachandran, Scott A. Young | 2019-09-03 |
| 10192303 | Method and system for mixed mode wafer inspection | Jason Z. Lin, Allen Park, Ellis Chang, Songnian Rong, Chetana Bhaskar | 2019-01-29 |
| 10132760 | Apparatus and methods for finding a best aperture and mode to enhance defect detection | Pavel Kolchin, Lisheng Gao, Grace Hsiu-Ling Chen, Markus Huber, Robert M. Danen | 2018-11-20 |
| 9880107 | Systems and methods for detecting defects on a wafer | Lu Chen, Jason Kirkwood, Mohan Mahadevan, James A. Smith, Lisheng Gao +2 more | 2018-01-30 |
| 9726617 | Apparatus and methods for finding a best aperture and mode to enhance defect detection | Pavel Kolchin, Lisheng Gao, Grace Hsiu-Ling Chen, Markus Huber, Robert M. Danen | 2017-08-08 |
| 8775101 | Detecting defects on a wafer | Junqing Huang, Yong Zhang, Stephanie Chen, Tao Luo, Lisheng Gao | 2014-07-08 |
| 8645100 | Status polling | Krishnamurthy Bhaskar, Mark J. Roulo, John S. Taylor, Lawrence R. Miller, Paul T. Russell +3 more | 2014-02-04 |
| 8611639 | Semiconductor device property extraction, generation, visualization, and monitoring methods | Ashok Kulkarni, Chien-Huei Chen, Cecelia Campochiaro, Yong Zhang, Brian Duffy | 2013-12-17 |
| 8467047 | Systems and methods for detecting defects on a wafer | Lu Chen, Jason Kirkwood, Mohan Mahadevan, James A. Smith, Lisheng Gao +2 more | 2013-06-18 |
| 8223327 | Systems and methods for detecting defects on a wafer | Lu Chen, Jason Kirkwood, Mohan Mahadevan, James A. Smith, Lisheng Gao +2 more | 2012-07-17 |
| 8204296 | Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a wafer | Kris Bhaskar, Mark A. McCord, Santosh Bhattacharyya, Ardis Liang, Hubert Altendorfer +1 more | 2012-06-19 |
| 8049877 | Computer-implemented methods, carrier media, and systems for selecting polarization settings for an inspection system | Stephanie Chen, Jason Kirkwood, Tao Luo, Yong Zhang, Lisheng Gao | 2011-11-01 |
| 8000905 | Computer-implemented methods, carrier media, and systems for determining sizes of defects detected on a wafer | Stephanie Chen, Subramanian Balakrishnan | 2011-08-16 |
| 7925072 | Methods for identifying array areas in dies formed on a wafer and methods for setting up such methods | Chien-Huei Chen, Ajay Gupta, Kaustubh (Kaust) Namjoshi, Mike Van Riet, Michael Cook | 2011-04-12 |