Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11450012 | BBP assisted defect detection flow for SEM images | Ge Cong, Sanbong Park, Boshi Huang | 2022-09-20 |
| 11151707 | System and method for difference filter and aperture selection using shallow deep learning | Jacob George, Saravanan Paramasivam, Martin Plihal | 2021-10-19 |
| 11047806 | Defect discovery and recipe optimization for inspection of three-dimensional semiconductor structures | Devashish Sharma, Christopher Maher, Bo Hua, Philip Measor, Robert M. Danen | 2021-06-29 |
| 11049745 | Defect-location determination using correction loop for pixel alignment | David Dowling, Tarunark Singh, Bjorn Brauer, Bryant Mantiply, Hucheng Lee +2 more | 2021-06-29 |
| 10832396 | And noise based care areas | Brian Duffy, Martin Plihal, Gordon Rouse, Chris Maher, Erfan Soltanmohammadi | 2020-11-10 |
| 10395358 | High sensitivity repeater defect detection | Bjorn Brauer, Eugene Shifrin, Ashok Mathew, Chetana Bhaskar, Lisheng Gao +2 more | 2019-08-27 |
| 10325361 | System, method and computer program product for automatically generating a wafer image to design coordinate mapping | — | 2019-06-18 |
| 10192302 | Combined patch and design-based defect detection | Bjorn Brauer | 2019-01-29 |
| 10151706 | Inspection for specimens with extensive die to die process variation | Hucheng Lee, Bjorn Brauer | 2018-12-11 |
| 10127651 | Defect sensitivity of semiconductor wafer inspectors using design data with wafer image data | Ashok Kulkarni, Saibal Banerjee, Bjorn Brauer | 2018-11-13 |
| 9996942 | Sub-pixel alignment of inspection to design | Pavan Kumar, Lisheng Gao, Thirupurasundari Jayaraman, Raghav Babulnath, Srikanth Kandukuri +4 more | 2018-06-12 |
| 9965848 | Shape based grouping | Saibal Banerjee, Ashok Kulkarni, Jagdish Chandra Saraswatula | 2018-05-08 |
| 9830421 | Alignment of inspection to design using built in targets | Bjorn Braeuer, Lisheng Gao | 2017-11-28 |
| 9087367 | Determining design coordinates for wafer defects | Ellis Chang, Michael J. Van Riet, Allen Park, Khurram Zafar | 2015-07-21 |
| 8204296 | Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a wafer | Kris Bhaskar, Mark A. McCord, Ardis Liang, Richard Wallingford, Hubert Altendorfer +1 more | 2012-06-19 |
| 8126255 | Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functions | Kris Bhaskar, Chetana Bhaskar, Ashok Kulkarni, Eliezer Rosengaus, Cecelia Campochiaro +6 more | 2012-02-28 |
| 7796804 | Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a wafer | Kris Bhaskar, Mark A. McCord, Ardis Liang, Richard Wallingford, Hubert Altendorfer +1 more | 2010-09-14 |
| 7756658 | Systems and methods for detecting defects on a wafer and generating inspection results for the wafer | Ashok Kulkarni | 2010-07-13 |
| 7747062 | Methods, defect review tools, and systems for locating a defect in a defect review process | Da Chen, Christophe David Fouquet, Saibal Banerjee, Joe Wang, Lian Yao +2 more | 2010-06-29 |
| 7440607 | Outlier substrate inspection | Jason Z. Lin, Hong Chen, Evgeni Shifrin, Ashok Kulkarni, Wei Zhao +1 more | 2008-10-21 |