Issued Patents All Time
Showing 1–25 of 37 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11863869 | Event detection using motion extracted image comparison | Lorenzo Sorgi | 2024-01-02 |
| 11265481 | Aligning and blending image data from multiple image sensors | Abhinav Kashyap, Lorenzo Sorgi | 2022-03-01 |
| 11204330 | Systems and methods for inspection of a specimen | Mehdi Vaez-Iravani | 2021-12-21 |
| 10999506 | Generating motion extracted images | Lorenzo Sorgi | 2021-05-04 |
| 10863105 | High dynamic range imaging for event detection and inventory management | Abhinav Kashyap, Lorenzo Sorgi | 2020-12-08 |
| 10535131 | Systems and methods for region-adaptive defect detection | Christopher Maher, Bjorn Brauer, Vijayakumar Ramachandran, Laurent Karsenti, John R. Jordan +1 more | 2020-01-14 |
| 10498963 | Motion extracted high dynamic range images | Lorenzo Sorgi | 2019-12-03 |
| 9222771 | Acquisition of information for a construction site | Ady Levy, Kris Bhaskar | 2015-12-29 |
| 9068917 | Systems and methods for inspection of a specimen | Mehdi Vaez-Iravani | 2015-06-30 |
| 9041930 | Digital pathology system | Scott A. Young, Ashok Kulkarni | 2015-05-26 |
| 8645100 | Status polling | Krishnamurthy Bhaskar, Mark J. Roulo, John S. Taylor, Lawrence R. Miller, Paul T. Russell +3 more | 2014-02-04 |
| 8600143 | Method and system for hierarchical tissue analysis and classification | Ashok Kulkarni, Scott A. Young | 2013-12-03 |
| 8126255 | Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functions | Kris Bhaskar, Chetana Bhaskar, Ashok Kulkarni, Cecelia Campochiaro, Chris Maher +6 more | 2012-02-28 |
| 7865037 | Memory load balancing | Krishnamurthy Bhaskar, Mark J. Roulo, John S. Taylor, Lawrence R. Miller, Paul T. Russell +3 more | 2011-01-04 |
| 7724362 | Oblique incidence macro wafer inspection | — | 2010-05-25 |
| 7719677 | Multi-spectral techniques for defocus detection | — | 2010-05-18 |
| 7602958 | Mirror node process verification | Krishnamurthy Bhaskar, Mark J. Roulo, John S. Taylor, Lawrence R. Miller, Paul T. Russell +3 more | 2009-10-13 |
| 7555409 | Daisy chained topology | Krishnamurthy Bhaskar, Mark J. Roulo, John S. Taylor, Lawrence R. Miller, Paul T. Russell +3 more | 2009-06-30 |
| 7417724 | Wafer inspection systems and methods for analyzing inspection data | Paul Sullivan, George Kren, Patrick Huet, Robinson Piramuthu, Martin Plihal +1 more | 2008-08-26 |
| 7397553 | Surface scanning | Courosh Mehanian, Steven W. Meeks | 2008-07-08 |
| 7379838 | Programmable image computer | Krishnamurthy Bhaskar, Mark J. Roulo, John S. Taylor, Lawrence R. Miller, Paul T. Russell +3 more | 2008-05-27 |
| 7324198 | Edge bead removal inspection by reflectometry | — | 2008-01-29 |
| 7280197 | Wafer edge inspection apparatus | — | 2007-10-09 |
| 7251586 | Full swath analysis | Krishnamurthy Bhaskar, Mark J. Roulo, John S. Taylor, Lawrence R. Miller, Paul T. Russell +3 more | 2007-07-31 |
| 7227628 | Wafer inspection systems and methods for analyzing inspection data | Paul Sullivan, George Kren, Patrick Huet, Robinson Piramuthu, Martin Plihal +1 more | 2007-06-05 |