Issued Patents All Time
Showing 26–37 of 37 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7181368 | Status polling | Krishnamurthy Bhaskar, Mark J. Roulo, John S. Taylor, Lawrence R. Miller, Paul T. Russell +3 more | 2007-02-20 |
| 7176433 | Resolution enhancement for macro wafer inspection | — | 2007-02-13 |
| 7149642 | Programmable image computer | Krishnamurthy Bhaskar, Mark J. Roulo, John S. Taylor, Lawrence R. Miller, Paul T. Russell +3 more | 2006-12-12 |
| 7142300 | Edge bead removal inspection by reflectometry | — | 2006-11-28 |
| 7076390 | Memory load balancing | Krishnamurthy Bhaskar, Mark J. Roulo, John S. Taylor, Lawrence R. Miller, Paul T. Russell +3 more | 2006-07-11 |
| 7072034 | Systems and methods for inspection of specimen surfaces | Lydia J. Young | 2006-07-04 |
| 7024339 | Full swath analysis | Krishnamurthy Bhaskar, Mark J. Roulo, John S. Taylor, Lawrence R. Miller, Paul T. Russell +3 more | 2006-04-04 |
| 6796697 | Illumination delivery system | Chris Bragg, Daniel Scott | 2004-09-28 |
| 6791680 | System and method for inspecting semiconductor wafers | Steven R. Lange | 2004-09-14 |
| 6020957 | System and method for inspecting semiconductor wafers | Steven R. Lange | 2000-02-01 |
| 5653539 | Method and apparatus for remotely measuring the temperature of a surface | — | 1997-08-05 |
| 4755874 | Emission microscopy system | Paul Esrig, Ezra Van Gelder | 1988-07-05 |