Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5640237 | Method and apparatus for detecting non-uniformities in reflective surafaces | Eric J. Hansotte | 1997-06-17 |
| 4755874 | Emission microscopy system | Eliezer Rosengaus, Ezra Van Gelder | 1988-07-05 |