Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11295438 | Method and system for mixed mode wafer inspection | Jason Z. Lin, Allen Park, Ellis Chang, Richard Wallingford, Songnian Rong | 2022-04-05 |
| 10395358 | High sensitivity repeater defect detection | Bjorn Brauer, Eugene Shifrin, Ashok Mathew, Lisheng Gao, Santosh Bhattacharyya +2 more | 2019-08-27 |
| 10192303 | Method and system for mixed mode wafer inspection | Jason Z. Lin, Allen Park, Ellis Chang, Richard Wallingford, Songnian Rong | 2019-01-29 |
| 9262821 | Inspection recipe setup from reference image variation | Eugene Shifrin, Ashok Kulkarni, Chien-Huei Chen, Kris Bhaskar, Brian Duffy | 2016-02-16 |
| 8126255 | Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functions | Kris Bhaskar, Ashok Kulkarni, Eliezer Rosengaus, Cecelia Campochiaro, Chris Maher +6 more | 2012-02-28 |
| 5502306 | Electron beam inspection system and method | Dan Meisburger, Alan D. Brodie, Curt H. Chadwick, Anil Desai, Hans-Peter Dohse +28 more | 1996-03-26 |