Issued Patents All Time
Showing 1–25 of 27 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12387318 | Hot spot defect detecting method and hot spot defect detecting system | Pei-Chao Su, Xiaomeng Chen, Chan-Ming Chang, Shih-Yung Chen, Hung-Yi Chung +6 more | 2025-08-12 |
| 12068207 | Simultaneous multi-bandwidth optical inspection of semiconductor devices | Shih-Chang Wang, Hsiu-Hui Huang, Hung-Yi Chung, Xiaomeng Chen | 2024-08-20 |
| 11900586 | Hot spot defect detecting method and hot spot defect detecting system | Pei-Chao Su, Xiaomeng Chen, Chan-Ming Chang, Shih-Yung Chen, Hung-Yi Chung +6 more | 2024-02-13 |
| 11231376 | Method for semiconductor wafer inspection and system thereof | Hung-Yi Chung, Xiaomeng Chen | 2022-01-25 |
| 10964014 | Defect detecting method and defect detecting system | — | 2021-03-30 |
| 10872406 | Hot spot defect detecting method and hot spot defect detecting system | Pei-Chao Su, Xiaomeng Chen, Chan-Ming Chang, Shih-Yung Chen, Hung-Yi Chung +6 more | 2020-12-22 |
| 10809635 | Defect inspection method and defect inspection system | Hung-Yi Chung, Chao-Ting Hong, Cheng-Kuang Lee, Xiaomeng Chen, Teng-Cheng Hsu | 2020-10-20 |
| 10482590 | Method and system for defect classification | Li He, Sankar Venkataraman, John R. Jordan, Huajun Ying, Sinha Harsh | 2019-11-19 |
| 9898811 | Method and system for defect classification | Li He, Sankar Venkataraman, John R. Jordan, Huajun Ying, Harsh Sinha | 2018-02-20 |
| 9489599 | Decision tree construction for automatic classification of defects on semiconductor wafers | Chris Maher, Patrick Huet, Tai-Kam Ng, John R. Jordan | 2016-11-08 |
| 9483819 | Contour-based array inspection of patterned defects | Ajay Gupta, Thanh Huy Ha, Jianwei Wang, Hedong Yang, Christopher Maher +1 more | 2016-11-01 |
| 9360863 | Data perturbation for wafer inspection or metrology setup using a model of a difference | Govind Thattaisundaram, Mohan Mahadevan, Ajay Gupta, Ashok Kulkarni, Jason Kirkwood +2 more | 2016-06-07 |
| 9262821 | Inspection recipe setup from reference image variation | Eugene Shifrin, Chetana Bhaskar, Ashok Kulkarni, Kris Bhaskar, Brian Duffy | 2016-02-16 |
| 9170211 | Design-based inspection using repeating structures | Ashok Kulkarni | 2015-10-27 |
| 9053390 | Automated inspection scenario generation | Mohan Mahadevan, Govind Thattaisundaram, Ajay Gupta, Jason Kirkwood, Ashok Kulkarni +3 more | 2015-06-09 |
| 8781781 | Dynamic care areas | Ashok Kulkarni | 2014-07-15 |
| 8669523 | Contour-based defect detection using an inspection apparatus | Peter White, Michael J. Van Riet, Sankar Venkataraman, Hai Jiang, Hedong Yang +1 more | 2014-03-11 |
| 8611639 | Semiconductor device property extraction, generation, visualization, and monitoring methods | Ashok Kulkarni, Cecelia Campochiaro, Richard Wallingford, Yong Zhang, Brian Duffy | 2013-12-17 |
| 8502146 | Methods and apparatus for classification of defects using surface height attributes | Hedong Yang, Cho H. Teh | 2013-08-06 |
| 8213705 | Methods for accurate identification of an edge of a care area for an array area formed on a wafer and methods for binning defects detected in an array area formed on a wafer | Xiaoming Wang, Eugene Shifrin, Tsung-Pao Fang | 2012-07-03 |
| 8139844 | Methods and systems for determining a defect criticality index for defects on wafers | Yan Xiong, Jianxin Zhang, Ellis Chang, Tsung-Pao Fang | 2012-03-20 |
| 8135204 | Computer-implemented methods, carrier media, and systems for creating a defect sample for use in selecting one or more parameters of an inspection recipe | Barry G. Becker, Hong Chen, Michael J. Van Riet, Chris Maher, Stephanie Chen +2 more | 2012-03-13 |
| 8000922 | Methods and systems for generating information to be used for selecting values for one or more parameters of a detection algorithm | Hong Chen, Michael J. Van Riet, Jason Z. Lin, Chris Maher, Michal Kowalski +4 more | 2011-08-16 |
| 7925072 | Methods for identifying array areas in dies formed on a wafer and methods for setting up such methods | Ajay Gupta, Richard Wallingford, Kaustubh (Kaust) Namjoshi, Mike Van Riet, Michael Cook | 2011-04-12 |
| 7894659 | Methods for accurate identification of an edge of a care area for an array area formed on a wafer and methods for binning defects detected in an array area formed on a wafer | Xiaoming Wang, Eugene Shifrin, Tsung-Pao Fang | 2011-02-22 |