Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10482590 | Method and system for defect classification | Li He, Chien-Huei Chen, Sankar Venkataraman, John R. Jordan, Huajun Ying | 2019-11-19 |
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Sinha Harsh — 1 Patent
Overall (All Time): #4,149,960 of 4,157,543Top 100%
1
Patents All Time