Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11580375 | Accelerated training of a machine learning based model for semiconductor applications | Kris Bhaskar, Laurent Karsenti, Scott A. Young, Mohan Mahadevan, Jing Zhang +4 more | 2023-02-14 |
| 10607119 | Unified neural network for defect detection and classification | Li He, Mohan Mahadevan, Sankar Venkataraman, Hedong Yang | 2020-03-31 |
| 10482590 | Method and system for defect classification | Li He, Chien-Huei Chen, Sankar Venkataraman, John R. Jordan, Sinha Harsh | 2019-11-19 |
| 10436720 | Adaptive automatic defect classification | Li He, Martin Plihal, Anadi Bhatia, Amitoz Singh Dandiana, Ramakanth Ramini | 2019-10-08 |
| 9898811 | Method and system for defect classification | Li He, Chien-Huei Chen, Sankar Venkataraman, John R. Jordan, Harsh Sinha | 2018-02-20 |