Issued Patents All Time
Showing 25 most recent of 26 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12423788 | Generalized anomaly detection | Roberto Annunziata, Philip Botros, Elizabeth Christiansen, Francesco Picciotti, Roshanak Zakizadeh +2 more | 2025-09-23 |
| 12205294 | Methods and systems for authentication of a physical document | Daniele Pizzocchero, Jimmy Daniel Moore, Jr., Zhiyuan Shi, Christos Sagonas, Yuanwei Li | 2025-01-21 |
| 12183107 | Signal-based machine learning fraud detection | Philip Botros, Romain Sabathe, Elizabeth Christiansen, Slavi Bonev, Roberto Annunziata | 2024-12-31 |
| 12067796 | Method for detecting fraud in documents | Jochem Gietema, Roberto Annunziata, Pieter-jan Reynaert, Elizaveta Ivanova, Yuanwei Li +4 more | 2024-08-20 |
| 11657631 | Scalable, flexible and robust template-based data extraction pipeline | Christos Sagonas, Karolina Dabkowska, Zhiyuan Shi, Edward Fieri Soler, Iona Grace Vincent +4 more | 2023-05-23 |
| 11580375 | Accelerated training of a machine learning based model for semiconductor applications | Kris Bhaskar, Laurent Karsenti, Scott A. Young, Jing Zhang, Brian Duffy +4 more | 2023-02-14 |
| 11237872 | Semiconductor inspection and metrology systems for distributing job among the CPUs or GPUs based on logical image processing boundaries | Ajay Gupta, Sankar Venkataraman, Sashi Balasingam | 2022-02-01 |
| 10769761 | Generating high resolution images from low resolution images for semiconductor applications | Saurabh Sharma, Amitoz Singh Dandiana, Chao Fang, Amir Azordegan, Brian Duffy | 2020-09-08 |
| 10733744 | Learning based approach for aligning images acquired with different modalities | Thanh Huy Ha, Scott A. Young | 2020-08-04 |
| 10605744 | Systems and methods for detecting defects on a wafer | Lu Chen, Jason Kirkwood, James A. Smith, Lisheng Gao, Junqing Huang +2 more | 2020-03-31 |
| 10607119 | Unified neural network for defect detection and classification | Li He, Sankar Venkataraman, Huajun Ying, Hedong Yang | 2020-03-31 |
| 10533954 | Apparatus and methods for combined brightfield, darkfield, and photothermal inspection | Lena Nicolaides, Alex Salnik, Scott A. Young | 2020-01-14 |
| 10395362 | Contour based defect detection | Ajay Gupta, Sankar Venkataraman, Hedong Yang, Laurent Karsenti, Yair Carmon +2 more | 2019-08-27 |
| 10360477 | Accelerating semiconductor-related computations using learning based models | Kris Bhaskar, Scott A. Young, Mark J. Roulo, Jing Zhang, Laurent Karsenti +1 more | 2019-07-23 |
| 10290088 | Wafer and lot based hierarchical method combining customized metrics with a global classification methodology to monitor process tool condition at extremely high throughput | Himanshu Vajaria, Tommaso Torelli, Bradley Ries | 2019-05-14 |
| 9880107 | Systems and methods for detecting defects on a wafer | Lu Chen, Jason Kirkwood, James A. Smith, Lisheng Gao, Junqing Huang +2 more | 2018-01-30 |
| 9772297 | Apparatus and methods for combined brightfield, darkfield, and photothermal inspection | Lena Nicolaides, Alex Salnik, Scott A. Young | 2017-09-26 |
| 9734568 | Automated inline inspection and metrology using shadow-gram images | Himanshu Vajaria, Sina Jahanbin, Bradley Ries | 2017-08-15 |
| 9645097 | In-line wafer edge inspection, wafer pre-alignment, and wafer cleaning | Lena Nicolaides, Ben-ming Benjamin Tsai, Prashant Aji, Michael Gasvoda, Stanley Stokowski +5 more | 2017-05-09 |
| 9640449 | Automated inline inspection of wafer edge strain profiles using rapid photoreflectance spectroscopy | Timothy Goodwin, Lena Nicolaides, Paul Horn, Shifang Li | 2017-05-02 |
| 9569834 | Automated image-based process monitoring and control | Himanshu Vajaria, Shabnam Ghadar, Tommaso Torelli, Bradley Ries, Stilian Ivanov Pandev | 2017-02-14 |
| 9360863 | Data perturbation for wafer inspection or metrology setup using a model of a difference | Govind Thattaisundaram, Ajay Gupta, Chien-Huei Chen, Ashok Kulkarni, Jason Kirkwood +2 more | 2016-06-07 |
| 9053390 | Automated inspection scenario generation | Govind Thattaisundaram, Ajay Gupta, Chien-Huei Chen, Jason Kirkwood, Ashok Kulkarni +3 more | 2015-06-09 |
| 8467047 | Systems and methods for detecting defects on a wafer | Lu Chen, Jason Kirkwood, James A. Smith, Lisheng Gao, Junqing Huang +2 more | 2013-06-18 |
| 8223327 | Systems and methods for detecting defects on a wafer | Lu Chen, Jason Kirkwood, James A. Smith, Lisheng Gao, Junqing Huang +2 more | 2012-07-17 |