Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12062165 | Characterization system and method with guided defect discovery | Bradley Ries, Muthukrishnan Sankar, Vineethanand Hariharan | 2024-08-13 |
| 11256967 | Characterization system and method with guided defect discovery | Bradley Ries, Muthukrishnan Sankar, Vineethanand Hariharan | 2022-02-22 |
| 10290088 | Wafer and lot based hierarchical method combining customized metrics with a global classification methodology to monitor process tool condition at extremely high throughput | Himanshu Vajaria, Bradley Ries, Mohan Mahadevan | 2019-05-14 |
| 9601393 | Selecting one or more parameters for inspection of a wafer | Chris W. Lee, Lisheng Gao, Tao Luo, Kenong Wu, Michael J. Van Riet +1 more | 2017-03-21 |
| 9569834 | Automated image-based process monitoring and control | Himanshu Vajaria, Shabnam Ghadar, Bradley Ries, Mohan Mahadevan, Stilian Ivanov Pandev | 2017-02-14 |
| 8532949 | Computer-implemented methods and systems for classifying defects on a specimen | Cho H. Teh, Dominic David, Chiuman Yeung, Michael Gordon Scott, Lalita A. Balasubramanian +5 more | 2013-09-10 |