Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12406226 | Distance-based product event detection | Krishna Vedula | 2025-09-02 |
| 10997710 | Adaptive care areas for die-die inspection | Jan Lauber, Yong Zhang | 2021-05-04 |
| 10949964 | Super-resolution defect review image generation through generative adversarial networks | Anuj Pandey, Bradley Ries, Yong Zhang, Rahul Lakhawat | 2021-03-16 |
| 10522376 | Multi-step image alignment method for large offset die-die inspection | Jan Lauber, Yong Zhang | 2019-12-31 |
| 10365639 | Feature selection and automated process window monitoring through outlier detection | Shabnam Ghadar, Sina Jahanbin, Bradley Ries | 2019-07-30 |
| 10290088 | Wafer and lot based hierarchical method combining customized metrics with a global classification methodology to monitor process tool condition at extremely high throughput | Tommaso Torelli, Bradley Ries, Mohan Mahadevan | 2019-05-14 |
| 9734568 | Automated inline inspection and metrology using shadow-gram images | Sina Jahanbin, Bradley Ries, Mohan Mahadevan | 2017-08-15 |
| 9569834 | Automated image-based process monitoring and control | Shabnam Ghadar, Tommaso Torelli, Bradley Ries, Mohan Mahadevan, Stilian Ivanov Pandev | 2017-02-14 |