Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10365639 | Feature selection and automated process window monitoring through outlier detection | Shabnam Ghadar, Himanshu Vajaria, Bradley Ries | 2019-07-30 |
| 9734568 | Automated inline inspection and metrology using shadow-gram images | Himanshu Vajaria, Bradley Ries, Mohan Mahadevan | 2017-08-15 |
| 8457414 | Detection of textural defects using a one class support vector machine | Alan Bovik, Eduardo Perez, Dinesh Nair | 2013-06-04 |