Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12062165 | Characterization system and method with guided defect discovery | Tommaso Torelli, Muthukrishnan Sankar, Vineethanand Hariharan | 2024-08-13 |
| 11922619 | Context-based defect inspection | Brian Duffy, Laurent Karsenti, Kuljit S. Virk, Asaf J. Elron, Ruslan Berdichevsky +7 more | 2024-03-05 |
| 11256967 | Characterization system and method with guided defect discovery | Tommaso Torelli, Muthukrishnan Sankar, Vineethanand Hariharan | 2022-02-22 |
| 10949964 | Super-resolution defect review image generation through generative adversarial networks | Anuj Pandey, Himanshu Vajaria, Yong Zhang, Rahul Lakhawat | 2021-03-16 |
| 10365639 | Feature selection and automated process window monitoring through outlier detection | Shabnam Ghadar, Sina Jahanbin, Himanshu Vajaria | 2019-07-30 |
| 10290088 | Wafer and lot based hierarchical method combining customized metrics with a global classification methodology to monitor process tool condition at extremely high throughput | Himanshu Vajaria, Tommaso Torelli, Mohan Mahadevan | 2019-05-14 |
| 9734568 | Automated inline inspection and metrology using shadow-gram images | Himanshu Vajaria, Sina Jahanbin, Mohan Mahadevan | 2017-08-15 |
| 9569834 | Automated image-based process monitoring and control | Himanshu Vajaria, Shabnam Ghadar, Tommaso Torelli, Mohan Mahadevan, Stilian Ivanov Pandev | 2017-02-14 |