Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12298254 | System and method for reducing sample noise using selective markers | Grace Hsiu-Ling Chen, Martin Gruebele | 2025-05-13 |
| 12211196 | Ensemble of deep learning models for defect review in high volume manufacturing | Vera Andreeva, Lawrence P. Muray | 2025-01-28 |
| 11922619 | Context-based defect inspection | Brian Duffy, Bradley Ries, Laurent Karsenti, Asaf J. Elron, Ruslan Berdichevsky +7 more | 2024-03-05 |
| 11410830 | Defect inspection and review using transmissive current image of charged particle beam system | Hong Xiao, Lawrence P. Muray, Nick Petrone, John Gerling, Abdurrahman Sezginer +3 more | 2022-08-09 |
| 11131629 | Apparatus and methods for measuring phase and amplitude of light through a layer | Abdurrahman Sezginer, Eric Vella | 2021-09-28 |