Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11699607 | Segmented multi-channel, backside illuminated, solid state detector with a through-hole for detecting secondary and backscattered electrons | Lawrence P. Muray, Alan D. Brodie, James Spallas, Marcel Trimpl | 2023-07-11 |
| 11410830 | Defect inspection and review using transmissive current image of charged particle beam system | Hong Xiao, Lawrence P. Muray, Nick Petrone, Abdurrahman Sezginer, Alan D. Brodie +3 more | 2022-08-09 |
| 10840056 | Multi-column scanning electron microscopy system | Robert Haynes, Aron Welk, Tomas Plettner, Mehran Nasser Ghodsi | 2020-11-17 |
| 10438769 | Array-based characterization tool | Alex Lipkind, Alon Rosenthal, Frank Chilese, Lawrence P. Muray, Robert Haynes | 2019-10-08 |
| 10354832 | Multi-column scanning electron microscopy system | Robert Haynes, Aron Welk, Christopher Sears, Felipe Fuks, Mehran Nasser-Ghodsi +1 more | 2019-07-16 |
| 10211021 | Permanent-magnet particle beam apparatus and method incorporating a non-magnetic metal portion for tunability | Tomas Plettner, Mohammed Tahmassebpur | 2019-02-19 |
| 9779872 | Apparatus and method for fine-tuning magnet arrays with localized energy delivery | — | 2017-10-03 |
| 9513230 | Apparatus and method for optical inspection, magnetic field and height mapping | Edward Wagner, Mehran Nasser-Ghodsi, Garrett Pickard, Tomas Plettner, Robert Haynes +1 more | 2016-12-06 |
| 9418819 | Asymmetrical detector design and methodology | Tomas Plettner, Mehran Nasser-Ghodsi | 2016-08-16 |
| 9390887 | Non-invasive charged particle beam monitor | Thomas Plettner | 2016-07-12 |