Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11699607 | Segmented multi-channel, backside illuminated, solid state detector with a through-hole for detecting secondary and backscattered electrons | John Gerling, Lawrence P. Muray, Alan D. Brodie, James Spallas | 2023-07-11 |
| 11610757 | Sensor module for scanning electron microscopy applications | — | 2023-03-21 |
| 10466212 | Scanning electron microscope and methods of inspecting and reviewing samples | David L. Brown, Yung-Ho Alex Chuang, John Fielden, Jingjing Zhang, Devis Contarato +1 more | 2019-11-05 |
| 9767986 | Scanning electron microscope and methods of inspecting and reviewing samples | David L. Brown, Yung-Ho Alex Chuang, John Fielden, Jingjing Zhang, Devis Contarato +1 more | 2017-09-19 |