Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10778925 | Multiple column per channel CCD sensor architecture for inspection and metrology | Yung-Ho Alex Chuang, Jingjing Zhang, Sharon Zamek, John Fielden, David L. Brown | 2020-09-15 |
| 10764527 | Dual-column-parallel CCD sensor and inspection systems using a sensor | Yung-Ho Alex Chuang, Jingjing Zhang, Sharon Zamek, John Fielden, David L. Brown | 2020-09-01 |
| 10466212 | Scanning electron microscope and methods of inspecting and reviewing samples | David L. Brown, Yung-Ho Alex Chuang, John Fielden, Marcel Trimpl, Jingjing Zhang +1 more | 2019-11-05 |
| 10462391 | Dark-field inspection using a low-noise sensor | Yung-Ho Alex Chuang, David L. Brown, John Fielden, Daniel Kavaldjiev, Guoheng Zhao +4 more | 2019-10-29 |
| 10313622 | Dual-column-parallel CCD sensor and inspection systems using a sensor | Yung-Ho Alex Chuang, Jingjing Zhang, Sharon Zamek, John Fielden, David L. Brown | 2019-06-04 |
| 9767986 | Scanning electron microscope and methods of inspecting and reviewing samples | David L. Brown, Yung-Ho Alex Chuang, John Fielden, Marcel Trimpl, Jingjing Zhang +1 more | 2017-09-19 |