Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
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Devis Contarato — 6 Patents

Kla-Tencor: 6 patents #431 of 2,049Top 25%
Redwood City, CA: #1,501 of 5,061 inventorsTop 30%
California: #94,478 of 386,348 inventorsTop 25%
Overall (All Time): #779,687 of 4,157,543Top 20%
6 Patents All Time
Devis Contarato has been granted 6 US patents while listed as an inventor at Kla-Tencor. The first was granted in 2017 and the most recent in September 2020. Devis Contarato ranks #779,687 of 4,157,543 US inventors in our database (top 18.8%). Patent records list Devis Contarato in Redwood City, CA, US.

Patents per Year

Patents granted per year, 2017 to 2020Bar chart with a peak of 3 patents in 2019.peak 32017: 1 patents20172019: 3 patents20192020: 2 patents2020

Issued Patents All Time

Showing 1–6 of 6 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
10778925 Multiple column per channel CCD sensor architecture for inspection and metrology Yung-Ho Alex Chuang, Jingjing Zhang, Sharon Zamek, John Fielden, David L. Brown 2020-09-15
10764527 Dual-column-parallel CCD sensor and inspection systems using a sensor Yung-Ho Alex Chuang, Jingjing Zhang, Sharon Zamek, John Fielden, David L. Brown 2020-09-01
10466212 Scanning electron microscope and methods of inspecting and reviewing samples David L. Brown, Yung-Ho Alex Chuang, John Fielden, Marcel Trimpl, Jingjing Zhang +1 more 2019-11-05 $161,444,000
10462391 Dark-field inspection using a low-noise sensor Yung-Ho Alex Chuang, David L. Brown, John Fielden, Daniel Kavaldjiev, Guoheng Zhao +4 more 2019-10-29
10313622 Dual-column-parallel CCD sensor and inspection systems using a sensor Yung-Ho Alex Chuang, Jingjing Zhang, Sharon Zamek, John Fielden, David L. Brown 2019-06-04
9767986 Scanning electron microscope and methods of inspecting and reviewing samples David L. Brown, Yung-Ho Alex Chuang, John Fielden, Marcel Trimpl, Jingjing Zhang +1 more 2017-09-19