Issued Patents All Time
Showing 25 most recent of 29 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12165838 | Joint electron-optical columns for flood-charging and image-forming in voltage contrast wafer inspections | Xinrong Jiang | 2024-12-10 |
| 12165831 | Method and system of image-forming multi-electron beams | Xinrong Jiang, Youfei Jiang, Sameet K. Shriyan, Jeong Ho Lee, Michael Steigerwald +1 more | 2024-12-10 |
| 11651934 | Systems and methods of creating multiple electron beams | Xinrong Jiang, Sameet K. Shriyan, Luca Grella, Kevin Cummings | 2023-05-16 |
| 11508591 | High resolution electron beam apparatus with dual-aperture schemes | Xinrong Jiang, Nikolai Chubun, Luca Grella | 2022-11-22 |
| 11335608 | Electron beam system for inspection and review of 3D devices | Xinrong Jiang | 2022-05-17 |
| 11302510 | Space charge insensitive electron gun designs | Luca Grella | 2022-04-12 |
| 11056312 | Micro stigmator array for multi electron beam system | Xinrong Jiang | 2021-07-06 |
| 11037753 | Magnetically microfocused electron emission source | — | 2021-06-15 |
| 10964522 | High resolution electron energy analyzer | Xinrong Jiang, Nikolai Chubun | 2021-03-30 |
| 10770258 | Method and system for edge-of-wafer inspection and review | Xinrong Jiang, Harsh Sinha, David Trease, David Kaz, Wei Ye | 2020-09-08 |
| 10748739 | Deflection array apparatus for multi-electron beam system | Xinrong Jiang | 2020-08-18 |
| 10354832 | Multi-column scanning electron microscopy system | Robert Haynes, John Gerling, Aron Welk, Felipe Fuks, Mehran Nasser-Ghodsi +1 more | 2019-07-16 |
| 10276346 | Particle beam inspector with independently-controllable beams | Brian Duffy, Amir Azordegan | 2019-04-30 |
| 10224177 | Method and system for aberration correction in an electron beam system | Xinrong Jiang, Sameet K. Shriyan | 2019-03-05 |
| 10096447 | Electron beam apparatus with high resolutions | Xinrong Jiang | 2018-10-09 |
| 10090131 | Method and system for aberration correction in an electron beam system | Xinrong Jiang | 2018-10-02 |
| 10056224 | Method and system for edge-of-wafer inspection and review | Xinrong Jiang, Harsh Sinha, David Trease, David Kaz, Wei Ye | 2018-08-21 |
| 9934933 | Extractor electrode for electron source | Laurence S. Hordon, Nikolai Chubun, Luca Grella, Xinrong Jiang, Daniel Bui +2 more | 2018-04-03 |
| 9881764 | Heat-spreading blanking system for high throughput electron beam apparatus | Xinrong Jiang, Douglas A. Larson | 2018-01-30 |
| 9805910 | Automated SEM nanoprobe tool | David Trease | 2017-10-31 |
| 9513230 | Apparatus and method for optical inspection, magnetic field and height mapping | John Gerling, Edward Wagner, Mehran Nasser-Ghodsi, Garrett Pickard, Tomas Plettner +1 more | 2016-12-06 |
| 9443693 | Notched magnetic lens for improved sample access in an SEM | — | 2016-09-13 |
| 8921782 | Tilt-imaging scanning electron microscope | Xinrong Jiang, Ichiro Honjo, Liqun Han | 2014-12-30 |
| 8698094 | Permanent magnet lens array | Mehran Nasser-Ghodsi, Khashayar Shadman | 2014-04-15 |
| 8658973 | Auger elemental identification algorithm | Mark A. Neil, Mehran Nasser-Ghodsi | 2014-02-25 |