Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12283453 | Creating multiple electron beams with a photocathode film | Xinrong Jiang, Youfei Jiang, Ralph Nyffenegger | 2025-04-22 |
| 12165831 | Method and system of image-forming multi-electron beams | Xinrong Jiang, Christopher Sears, Youfei Jiang, Sameet K. Shriyan, Jeong Ho Lee +1 more | 2024-12-10 |
| 12068129 | Tilt-column multi-beam electron microscopy system and method | Xinrong Jiang, Youfei Jiang, Ralph Nyffenegger | 2024-08-20 |
| 11749495 | Bandpass charged particle energy filtering detector for charged particle tools | Youfei Jiang | 2023-09-05 |
| 8304750 | Scanning charged particle beams | Dirk Preikszas, Joerg Ackermann | 2012-11-06 |
| 8283641 | Positioning device for a particle beam apparatus | Dietmar Dönitz, Dirk Preixszas | 2012-10-09 |
| 8063364 | Particle optical device with magnet assembly | Dirk Preikszas, Daniel Tobias, Andreas Eisele, Momme Mommsen, Dietmar Doenitz +1 more | 2011-11-22 |
| 7910887 | Electron-beam device and detector system | Dirk Preikszas, Volker Drexel | 2011-03-22 |
| 7518122 | Ion sources, systems and methods | Billy W. Ward, John A. Notte, IV, Louis S. Farkas, III, Randall G. Percival, Raymond Hill +1 more | 2009-04-14 |
| 7507962 | Electron-beam device and detector system | Dirk Preikszas, Volker Drexel | 2009-03-24 |
| 7425701 | Electron-beam device and detector system | Dirk Preikszas, Volker Drexel | 2008-09-16 |
| 7022987 | Particle-optical arrangements and particle-optical systems | Dirk Preikszas | 2006-04-04 |
| 6949744 | Electron microscopy system, electron microscopy method and focusing system for charged particles | Erik Essers | 2005-09-27 |
| 6903337 | Examining system for the particle-optical imaging of an object, deflector for charged particles as well as method for the operation of the same | Oliver Kienzle, Dirk Stenkamp, Rainer Knippelmeyer, Max Haider, Heiko Müller +1 more | 2005-06-07 |
| 6855938 | Objective lens for an electron microscopy system and electron microscopy system | Dirk Preikszas, Peter Hoffrogge, Peter Gnauck | 2005-02-15 |
| 6828565 | Electron beam source, electron optical apparatus using such beam source and method of operating and electron beam source | — | 2004-12-07 |