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USPTO Patent Rankings Data through Dec 31, 2025
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Oliver Kienzle — 19 Patents

Applied Materials: 7 patents #1,734 of 7,310Top 25%
CGCarl Zeiss Nts Gmbh: 5 patents #6 of 103Top 6%
CGCarl Zeiss Smt Gmbh: 5 patents #264 of 1,189Top 25%
CGCarl Zeiss Microscopy Gmbh: 4 patents #120 of 564Top 25%
CSCarl Zeiss Sms: 3 patents #25 of 118Top 25%
CACarl Ziess Smt Ag: 2 patents #1 of 34Top 3%
Jena, DE: #54 of 1,492 inventorsTop 4%
Overall (All Time): #229,345 of 4,157,543Top 6%
19 Patents All Time
Oliver Kienzle has been granted 19 US patents while listed as an inventor at Applied Materials. The first was granted in 2003 and the most recent in December 2019. Oliver Kienzle ranks #229,345 of 4,157,543 US inventors in our database (top 5.5%). Patent records list Oliver Kienzle in Jena, DE.

Issued Patents All Time

Showing 1–19 of 19 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
10504681 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements Rainer Knippelmeyer, Thomas Kemen, Heiko Mueller, Stephan Uhlemann, Maximilian Haider +2 more 2019-12-10
9673024 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements Rainer Knippelmeyer, Thomas Kemen, Heiko Mueller, Stephan Uhlemann, Maximilian Haider +2 more 2017-06-06 $20,400,000
9224576 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements Rainer Knippelmeyer, Thomas Kemen, Heiko Mueller, Stephan Uhlemann, Maximilian Haider +2 more 2015-12-29
8637834 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements Rainer Knippelmeyer, Thomas Kemen, Heiko Mueller, Stephan Uhlemann, Maximillian Haider +2 more 2014-01-28 $15,652,000
8268516 Method for repairing phase shift masks Axel Zibold, Peter Kuschnerus 2012-09-18
8264535 Method and apparatus for analyzing a group of photolithographic masks Rigo Richter, Norbert Rosenkranz, Yuji Kobiyama, Thomas Scheruebl 2012-09-11
8097847 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements Rainer Knippelmeyer, Thomas Kemen, Heiko Mueller, Stephan Uhlemann, Maximilian Haider +1 more 2012-01-17 $12,497,000
7916930 Method and arrangement for repairing photolithography masks Axel Zibold, Wolfgang Harnisch 2011-03-29
7554094 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements Rainer Knippelmeyer, Thomas Kemen, Heiko Mueller, Stephan Uhlemann, Maximilian Haider +1 more 2009-06-30 $19,701,000
7244949 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements Rainer Knippelmeyer 2007-07-17 $16,677,000
7135677 Beam guiding arrangement, imaging method, electron microscopy system and electron lithography system Rainer Knippelmeyer, Stephan Uhlemann, Max Haider, Heiko Müller 2006-11-14
7015487 Apparatus and method for exposing a radiation sensitive layer by means of charged particles as well as a mask for this purpose Alexander Orchowski 2006-03-21
6967328 Method for the electron-microscopic observation of a semiconductor arrangement and apparatus therefor Rainer Knippelmeyer, Ingo Muller 2005-11-22
6946657 Electron microscopy system Rainer Knippelmeyer, Heiko Müller 2005-09-20
6914249 Particle-optical apparatus, electron microscopy system and electron lithography system Rainer Knippelmeyer 2005-07-05
6903337 Examining system for the particle-optical imaging of an object, deflector for charged particles as well as method for the operation of the same Dirk Stenkamp, Michael Steigerwald, Rainer Knippelmeyer, Max Haider, Heiko Müller +1 more 2005-06-07
6878936 Applications operating with beams of charged particles Rainer Knippelmeyer 2005-04-12
6756599 Particle-optical apparatus, illumination apparatus and projection system as well as a method employing the same 2004-06-29
6642525 Particle-optical component and system comprising a particle-optical component Holger Weigand 2003-11-04