SU

Stephan Uhlemann

CG Ceos Corrected Electron Optical Systems Gmbh: 7 patents #1 of 10Top 10%
Applied Materials: 6 patents #1,918 of 7,310Top 30%
CG Carl Zeiss Microscopy Gmbh: 4 patents #120 of 564Top 25%
CA Carl Ziess Smt Ag: 2 patents #1 of 34Top 3%
CG Carl Zeiss Smt Gmbh: 1 patents #657 of 1,189Top 60%
CG Carl Zeiss Nts Gmbh: 1 patents #39 of 103Top 40%
CS Carl Zeiss Stiftung: 1 patents #277 of 654Top 45%
Overall (All Time): #221,385 of 4,157,543Top 6%
20
Patents All Time

Issued Patents All Time

Showing 1–20 of 20 patents

Patent #TitleCo-InventorsDate
11081313 Particle-optical corrector which is free from axial aberrations of sixth order and electron microscope with corrector 2021-08-03
10504681 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements Rainer Knippelmeyer, Oliver Kienzle, Thomas Kemen, Heiko Mueller, Maximilian Haider +2 more 2019-12-10
9673024 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements Rainer Knippelmeyer, Oliver Kienzle, Thomas Kemen, Heiko Mueller, Maximilian Haider +2 more 2017-06-06
9224576 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements Rainer Knippelmeyer, Oliver Kienzle, Thomas Kemen, Heiko Mueller, Maximilian Haider +2 more 2015-12-29
8637834 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements Rainer Knippelmeyer, Oliver Kienzle, Thomas Kemen, Heiko Mueller, Maximillian Haider +2 more 2014-01-28
8362442 Corrector Joachim Zach 2013-01-29
8097847 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements Rainer Knippelmeyer, Oliver Kienzle, Thomas Kemen, Heiko Mueller, Maximilian Haider +1 more 2012-01-17
7800074 Electron-optical corrector for an aplanatic imaging system 2010-09-21
7800076 Electron-optical corrector for aplanatic imaging systems Harald Rose, Heiko Müller 2010-09-21
7745783 Monochromator and radiation source with monochromator 2010-06-29
7554094 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements Rainer Knippelmeyer, Oliver Kienzle, Thomas Kemen, Heiko Mueller, Maximilian Haider +1 more 2009-06-30
7135677 Beam guiding arrangement, imaging method, electron microscopy system and electron lithography system Oliver Kienzle, Rainer Knippelmeyer, Max Haider, Heiko Müller 2006-11-14
6995378 Lens array with a laterally movable optical axis for corpuscular rays Maximilan Haider, Heiko Müller 2006-02-07
6903337 Examining system for the particle-optical imaging of an object, deflector for charged particles as well as method for the operation of the same Oliver Kienzle, Dirk Stenkamp, Michael Steigerwald, Rainer Knippelmeyer, Max Haider +1 more 2005-06-07
6836372 Electrostatic corrector Harald Rose, Christoph Weissbacker 2004-12-28
6797962 Electrostatic corrector for eliminating the chromatic aberration of particle lenses Harald Rose, Christoph Weissbacker 2004-09-28
6770878 Electron/ion gun for electron or ion beams with high monochromasy or high current density Maximilian Haider 2004-08-03
6646267 Method for eliminating first, second and third-order axial image deformations during correction of the third-order spherical aberration in electron optical systems Maximilian Haider 2003-11-11
6605810 Device for correcting third-order spherical aberration in a lens, especially the objective lens of an electronic microscope Maximilian Haider 2003-08-12
5449914 Imaging electron energy filter Harald Rose, Eugen Weimer 1995-09-12