Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7462839 | Detector for variable pressure areas and an electron microscope comprising a corresponding detector | Volker Drexel, David Bate, Eric Essers | 2008-12-09 |
| 6872956 | Particle beam device with a particle source to be operated in high vacuum and cascade-type pump arrangement for such a particle beam device | Volker Drexel | 2005-03-29 |
| 6855938 | Objective lens for an electron microscopy system and electron microscopy system | Dirk Preikszas, Michael Steigerwald, Peter Hoffrogge | 2005-02-15 |
| 6218663 | Process and device for ion thinning in a high resolution transmission electron microscope | Wilfried Nisch | 2001-04-17 |