VD

Volker Drexel

CG Carl Zeiss Nts Gmbh: 8 patents #3 of 103Top 3%
CG Carl Zeiss Microscopy Gmbh: 5 patents #95 of 564Top 20%
LG Leo Elektronenmikroskopie Gmbh: 1 patents #5 of 21Top 25%
📍 Oberkochen, DE: #40 of 377 inventorsTop 15%
Overall (All Time): #352,431 of 4,157,543Top 9%
14
Patents All Time

Issued Patents All Time

Showing 1–14 of 14 patents

Patent #TitleCo-InventorsDate
10446360 Particle source for producing a particle beam and particle-optical apparatus Bernd Hafner 2019-10-15
8723138 Electron beam source and method of manufacturing the same Ulrich Mantz, Bernd Irmer, Christian Penzkofer 2014-05-13
8536773 Electron beam source and method of manufacturing the same Wolfram Buehler 2013-09-17
8431894 Electron beam device Erik Essers, Gerd Benner 2013-04-30
8362443 Objective lens 2013-01-29
8178849 Objective lens 2012-05-15
8164071 Electron beam source and method of manufacturing the same Ulrich Mantz, Bernd Irmer, Christian Penzkofer 2012-04-24
7910887 Electron-beam device and detector system Michael Steigerwald, Dirk Preikszas 2011-03-22
7507962 Electron-beam device and detector system Michael Steigerwald, Dirk Preikszas 2009-03-24
7462839 Detector for variable pressure areas and an electron microscope comprising a corresponding detector Peter Gnauck, David Bate, Eric Essers 2008-12-09
7425701 Electron-beam device and detector system Michael Steigerwald, Dirk Preikszas 2008-09-16
7060978 Detector system for a particle beam apparatus, and particle beam apparatus with such a detector system Johannes Bihr, Gerd Benner, Stephan Kujawa 2006-06-13
6872956 Particle beam device with a particle source to be operated in high vacuum and cascade-type pump arrangement for such a particle beam device Peter Gnauck 2005-03-29
6498345 Particle beam device Eugen Weimer 2002-12-24