SK

Stephan Kujawa

FE Fei: 2 patents #250 of 681Top 40%
CG Carl Zeiss Nts Gmbh: 1 patents #39 of 103Top 40%
LG Leo Elektronenmikroskopie Gmbh: 1 patents #5 of 21Top 25%
MA Mse Technology Applications: 1 patents #5 of 10Top 50%
Overall (All Time): #722,811 of 4,157,543Top 20%
7
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10832901 EELS detection technique in an electron microscope Bert Henning Freitag, Sorin Lazar, Maarten Kuijper, Gerard Nicolaas Anne van Veen, Peter Christiaan Tiemeijer +1 more 2020-11-10
9658246 Method of studying a sample in an ETEM Stan Johan Pieter Konings, Petrus Hubertus Franciscus Trompenaars 2017-05-23
7060978 Detector system for a particle beam apparatus, and particle beam apparatus with such a detector system Volker Drexel, Johannes Bihr, Gerd Benner 2006-06-13
6384412 Electron microscope with an energy filter having hexapole correctors which are coupled with a projective system downstream of the energy filter Dieter Krahl 2002-05-07
6153158 Method and apparatus for treating gaseous effluents from waste treatment systems Philip A. Flannery 2000-11-28
5877394 Method for treating waste containing stainless steel Daniel M. Battleson, Edward L. Rademacher, Jr., Patrick V. Cashell, Krag D. Filius, Philip A. Flannery +1 more 1999-03-02
5731564 Method of operating a centrifugal plasma arc furnace Daniel M. Battleson, Edward L. Rademacher, Jr., Patrick V. Cashell, Krag D. Filius, Philip A. Flannery +1 more 1998-03-24