Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10832901 | EELS detection technique in an electron microscope | Bert Henning Freitag, Sorin Lazar, Maarten Kuijper, Gerard Nicolaas Anne van Veen, Peter Christiaan Tiemeijer +1 more | 2020-11-10 |
| 9658246 | Method of studying a sample in an ETEM | Stan Johan Pieter Konings, Petrus Hubertus Franciscus Trompenaars | 2017-05-23 |
| 7060978 | Detector system for a particle beam apparatus, and particle beam apparatus with such a detector system | Volker Drexel, Johannes Bihr, Gerd Benner | 2006-06-13 |
| 6384412 | Electron microscope with an energy filter having hexapole correctors which are coupled with a projective system downstream of the energy filter | Dieter Krahl | 2002-05-07 |
| 6153158 | Method and apparatus for treating gaseous effluents from waste treatment systems | Philip A. Flannery | 2000-11-28 |
| 5877394 | Method for treating waste containing stainless steel | Daniel M. Battleson, Edward L. Rademacher, Jr., Patrick V. Cashell, Krag D. Filius, Philip A. Flannery +1 more | 1999-03-02 |
| 5731564 | Method of operating a centrifugal plasma arc furnace | Daniel M. Battleson, Edward L. Rademacher, Jr., Patrick V. Cashell, Krag D. Filius, Philip A. Flannery +1 more | 1998-03-24 |