Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12165835 | Stroboscopic illumination synchronized electron detection and imaging | Bart Jozef Janssen | 2024-12-10 |
| 11551906 | Time-gated detection, dual-layer SPAD-based electron detection | Bart Jozef Janssen, Erik René Kieft | 2023-01-10 |
| 10971326 | Multi-electron-beam imaging apparatus with improved performance | Ali Mohammadi-Gheidari, Peter Christiaan Tiemeijer, Erik René Kieft | 2021-04-06 |
| 10832901 | EELS detection technique in an electron microscope | Bert Henning Freitag, Sorin Lazar, Stephan Kujawa, Maarten Kuijper, Peter Christiaan Tiemeijer +1 more | 2020-11-10 |
| 10651005 | Innovative source assembly for ion beam production | Leon van Kouwen | 2020-05-12 |
| 10607811 | Multi-beam scanning transmission charged particle microscope | Ali Mohammadi-Gheidari, Ivan Lazic, Eric Gerardus Theodoor Bosch | 2020-03-31 |
| 10453647 | Emission noise correction of a charged particle source | Ali Mohammadi-Gheidari, Luigi Mele, Peter Christiaan Tiemeijer, Hendrik Nicolaas Slingerland | 2019-10-22 |
| 9941094 | Innovative source assembly for ion beam production | Leon van Kouwen | 2018-04-10 |
| 9812287 | Charged particle microscope with improved spectroscopic functionality | Cornelis Sander Kooijman, Thijs Thomas Withaar | 2017-11-07 |
| 9778377 | Method of performing spectroscopy in a transmission charged-particle microscope | Luigi Mele, Albertus Aemillius Seyno Sluijterman | 2017-10-03 |
| 9741529 | Micro-chamber for inspecting sample material | Luigi Mele, Pleun Dona | 2017-08-22 |
| 9620330 | Mathematical image assembly in a scanning-type microscope | Pavel Poto{hacek over (c)}ek, Cornelis Sander Kooijman, Hendrik Nicolaas Slingerland, Faysal Boughorbel | 2017-04-11 |
| 8450820 | Radiation detector | Lis Karen Nanver, Thomas Ludovicus Maria Scholtes, Agata {hacek over (S)}akić, Cornelis Sander Kooijman | 2013-05-28 |
| 7474419 | Stage assembly, particle-optical apparatus comprising such a stage assembly, and method of treating a sample in such an apparatus | Hendrik Gezinus Tappel, Ian Johannes Bernardus van Hees, Danny Lankers, Richard Young, Lucille A. Giannuzzi | 2009-01-06 |
| 6963068 | Method for the manufacture and transmissive irradiation of a sample, and particle-optical system | Peter E. S. J. Asselbergs, Hendrik Gezinus Tappel | 2005-11-08 |